The evolution of α-Al2O3 Al2p peaks is represented in Figures 9(a) and 9(b), for temperature increasing from 873 to 1473 K. At 1373 K, the α-Al2O3 peak is symmetrical and the BE position is given at 74.45 eV (FWHM 1.97 eV). Aluminum oxide (Al2O3) amorphous structure with short-range order and long-range disorder has presented promising applications in optical and optoelectronic devices. 2019 May 18;20(10):2468. doi: 10.3390/ijms20102468. The AFM indicates that the surface morphologies of all samples are smooth and crack-free with similar surface roughness values. Figure 2(a) shows nodules form during the early stages of oxidation; they consist of oxides enriched by Al, Fe, Cr, Si, or Mg. Fe/Cr oxides were detected for temperatures between 873 and 1073 K, and cracks and porosities are observed at 1073 K, as shown in Figure 2(b). Large thin sheets of Sapphire can be made by ribbon growth. The present study aims at examining whether FTIR and XPS analysis may provide a simple probe to various structural varieties of Al2O3 for applications of high temperature materials. The electronic response of material depends on its dielectric function, which reflects the interaction between the electrons and the applied field in materials. In ALD, the monolayer deposition and the alternating precursor pulse can guarantee an excellent film deposition quality and uniform rate [7, 8]. Spectroscopic ellipsometer (SE) is an important thin film measurement technology for its nondestructive and sensitive advantages [18]. The decomposition of the C1s signal in the domain (oxidation PM2000 at 873–1473 K) results in too bands (Figures 15(a) and 15(b)). It is likely because of the different testing principle in the two methods. Cai, Y.-X. Therefore, a precise control of surface morphology during film growth process is very crucial to device performance. Copyright © 2020 Elsevier B.V. or its licensors or contributors. Besides, the ultraviolet-visible spectra were examined with ultraviolet and visible spectrophotometer (UV, SHIMADZU UV-1700 ultraviolet and visible spectrophotometer) which can extract the band gap evolution to support the SE results. 2010 Apr;40(4):328-46 Epub 2015 Sep 11. NLM The surface defects may exist in the films, including the stress and strain change or the imperfect crystal. Al2O3 thin films find a number of applications in optoelectronics, sensors and tribology. The ratio of defects and the volume ratio of air have an effect on the film surface with different thickness. Sign up here as a reviewer to help fast-track new submissions. 2015;10(10):1683-706. doi: 10.2217/fmb.15.48. FTIR spectra of oxidized PM2000 at various temperatures from 873 K to 1473 K. FTIR spectra of oxidized PM2000 at 873 K (a), 973 K and 1073 K (b), 1173 K (c), and 1373 K (d). When oxidizing at 873 K and 973 K, the spectra corresponding to the Cr2p3/2 and Cr2p1/2 bands are significant and located in the range 576–580 eV and 584–590 eV, respectively (Figures 12(a) and 12(b)). (iv)An XPS spectrometer was used to qualitatively and quantitatively verify the composition of the different powder compounds. Epub 2017 Apr 11. Pseudomonas aeruginosa: arsenal of resistance mechanisms, decades of changing resistance profiles, and future antimicrobial therapies. 2015AA042601), and Shanxi “1331 Project” Key Subject Construction (1331KSC). The spectrum (Figure 6(a)) at 873 K in the range 400–1000 cm −1 represents a poorly crystallized structure characterized by a broadband with no apparent thin peak. The Fe-based alloy PM2000 strengthened by oxide dispersion (ODS) received from Schwarzkopf Plansee was used; the chemical composition in weight percent is as follows: A1-5.0, Cr-22.0, Mn-0.2, C-0.02, Si-0.3, Y-0.1, Zr-0.1, and Fe-balance.
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